Systems and methods that allow for simultaneous sensor and signal conditioning circuit performance testing

ABSTRACT

A sensor system with performance compensation testing capability includes a sensor device, a resistance bridge, a signal conditioning circuit, a first test connector, and a second test connector. The resistance bridge circuit is disposed on the sensor device and includes an excitation terminal, a circuit common terminal, and two output terminals, and is configured, upon being energized, to supply a bridge output voltage across the two output terminals. The signal conditioning circuit is electrically coupled to the excitation terminal, the circuit common terminal, and the two output terminals, and is configured to supply a sensor output signal representative of bridge output voltage. The first test connector is electrically coupled to one of the two output terminals and is configured to be coupled to an impedance test device. The second test connector is electrically coupled to the circuit common terminal and is configured to be coupled to the impedance test device.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No.14/281,216, filed on May 19, 2014 and entitled, “SYSTEMS AND METHODSTHAT ALLOW FOR SIMULTANEOUS SENSOR AND SIGNAL CONDITIONING CIRCUITPERFORMANCE,” which is incorporated herein by reference in its entirety.

TECHNICAL FIELD

The present invention generally relates to sensor systems, and moreparticularly relates to sensor systems and methods that allowsimultaneous sensor and signal conditioning circuit performance testing.

BACKGROUND

Sensors are used in myriad systems and environments to sense variousphysical phenomena. Many sensors are implemented using one or morevariable resistances connected together to form a resistance bridgecircuit. The resistance bridge circuit is typically coupled to a signalconditioning circuit. The signal conditioning circuit typically providesexcitation voltage to the resistance bridge circuit, and additionallyimplements various functions to appropriately condition the resistancebridge circuit output signal.

One of the functions that the signal conditioning circuit implementsincludes performance compensation that results from non-linearity ortemperature-based shifts in the output of the resistance bridge circuit.Moreover, the signal conditioning circuit itself may need to becompensated for its own performance shifts. To properly implement theperformance compensation for operation, the sensor system (i.e., sensorand signal conditioning circuit) undergo performance compensationtesting.

It is preferable to simultaneously conduct performance compensationtesting on the sensor and signal conditioning circuit. However, for somesensor system applications this is not practical. For example, when thesensor system needs to undergo relatively high pressure and/or hightemperature, and/or wide ranges of pressure and/or temperature,providing a suitable test setup can be relatively complicated, costly,and time-consuming. Thus, in many instances, the signal conditioningcircuit undergoes separate performance testing, which increases overallcycle time, process costs, and testing costs.

Hence, there is a need for a system and method that readily facilitatessimultaneous performance compensation testing of both the sensor andsignal conditioning circuit of a sensor system. The present inventionaddresses at least this need.

BRIEF SUMMARY

This summary is provided to describe select concepts in a simplifiedform that are further described in the Detailed Description. Thissummary is not intended to identify key or essential features of theclaimed subject matter, nor is it intended to be used as an aid indetermining the scope of the claimed subject matter.

In one embodiment, a sensor system with performance compensation testingcapability includes a sensor device, a resistance bridge, a signalconditioning circuit, a first test connector, and a second testconnector. The resistance bridge circuit is disposed on the sensordevice and includes an excitation terminal, a circuit common terminal,and two output terminals. The resistance bridge circuit is configured,upon being energized, to supply a bridge output voltage across the twooutput terminals. The signal conditioning circuit is electricallycoupled to the excitation terminal, the circuit common terminal, and thetwo output terminals. The signal conditioning circuit is configured tosupply a sensor output signal representative of the bridge outputvoltage. The first test connector is electrically coupled to one of thetwo output terminals and is configured to be coupled to an impedancetest device. The second test connector is electrically coupled to thecircuit common terminal and is configured to be coupled to the impedancetest device.

In another embodiment, a method for testing a sensor circuit that isconfigured to supply a sensor output signal includes connecting animpedance test device to the sensor circuit. The impedance test deviceconfigured to electrically couple a resistance to the sensor circuit.The sensor circuit is placed at a first temperature, and the impedanceof the impedance test device is varied at a plurality of differenttemperatures. The sensor output signal is observed while varying theimpedance of the impedance test device at the plurality of differenttemperatures. The sensor circuit a sensor device, a resistance bridge, asignal conditioning circuit, a first test connector, and a second testconnector. The resistance bridge circuit is disposed on the sensordevice and includes an excitation terminal, a circuit common terminal,and two output terminals. The resistance bridge circuit is configured,upon being energized, to supply a bridge output voltage across the twooutput terminals. The signal conditioning circuit is electricallycoupled to the excitation terminal, the circuit common terminal, and thetwo output terminals. The signal conditioning circuit is configured tosupply a sensor output signal representative of the bridge outputvoltage. The first test connector is electrically coupled to one of thetwo output terminals and is configured to be coupled to an impedancetest device. The second test connector is electrically coupled to thecircuit common terminal and is configured to be coupled to the impedancetest device.

In yet another embodiment, a method of making a sensor device includesdisposing a resistance bridge circuit on a sensor device. The resistancebridge circuit includes an excitation terminal, a circuit commonterminal, and two output terminals, and the resistance bridge circuit isconfigured, upon being energized, to supply a bridge output voltageacross the two output terminals. The resistance bridge circuit andsensor device are disposed in a sensor housing assembly. A signalconditioning circuit is electrically connected to the excitationterminal, the circuit common terminal, and the two output terminals. Thesignal conditioning circuit is configured to supply a sensor outputsignal representative of the bridge output voltage. The signalconditioning circuit is disposed in the sensor housing assembly. A firsttest connector is electrically coupled to one of the two outputterminals and is configured to be coupled to an impedance test device.The first test connector is disposed on or in the sensor housingassembly. A second test connector is electrically coupled to the circuitcommon terminal and is configured to be coupled to the impedance testdevice. The second test connector is disposed on or in the sensorhousing assembly.

Furthermore, other desirable features and characteristics of the sensorsystem and method will become apparent from the subsequent detaileddescription and the appended claims, taken in conjunction with theaccompanying drawings and the preceding background.

BRIEF DESCRIPTION OF THE DRAWINGS

The present invention will hereinafter be described in conjunction withthe following drawing figures, wherein like numerals denote likeelements, and wherein:

FIG. 1 depicts a simplified representation of one embodiment of a sensorsystem; and

FIG. 2 depicts a simplified functional block diagram of an embodiment ofa portion of the electronics that comprise the sensor system of FIG. 1.

DETAILED DESCRIPTION

The following detailed description is merely exemplary in nature and isnot intended to limit the invention or the application and uses of theinvention. As used herein, the word “exemplary” means “serving as anexample, instance, or illustration.” Thus, any embodiment describedherein as “exemplary” is not necessarily to be construed as preferred oradvantageous over other embodiments. All of the embodiments describedherein are exemplary embodiments provided to enable persons skilled inthe art to make or use the invention and not to limit the scope of theinvention which is defined by the claims. Furthermore, there is nointention to be bound by any expressed or implied theory presented inthe preceding technical field, background, brief summary, or thefollowing detailed description.

Referring now to FIGS. 1 and 2, a simplified representation of oneembodiment of a sensor system 100 is depicted in FIG. 1, and asimplified functional block diagram of an embodiment of a portion of theelectronics 200 that comprise the sensor system 100 is depicted in FIG.2. Before describing the sensor system 100 in more detail, it should benoted that although the depicted and described sensor system 100 isconfigured as a pressure sensor system, the concepts described hereinare not limited to use with pressure sensors, but may also be used withother types of sensors.

The sensor system 100 includes a sensor device 102, a resistance bridgecircuit 104, a signal conditioning circuit 106, an output connector 108,a first test connector 112, and a second test connector 114, all mountedin or on a sensor housing assembly 116. It will be appreciated that thesensor system 100 may include additional components, not just thosedepicted and described herein.

The sensor device 102, at least in the depicted embodiment, isconfigured as a pressure sensor, and more particularly as adiaphragm-type pressure sensor. As is generally known, with this type ofsensor, one side of the sensor device 102 is configured to be exposed toa monitored pressure. To facilitate this, the sensor housing assembly116 has an opening 118 formed therein to expose the sensor device to themonitored pressure.

The other side of the sensor device 102 has measurement circuitrydisposed thereon. In this embodiment, the measurement circuitrycomprises the resistance bridge circuit 104. The resistance bridgecircuit 104, which is shown more clearly in FIG. 2, comprises aplurality of variable resistances 202 connected together in aconventional Wheatstone bridge configuration, and includes an excitationterminal 204, a circuit common terminal 206, and two output terminals—afirst output terminal 208 and a second output terminal 212. As is alsogenerally known, the resistance bridge circuit 104 is configured, uponbeing energized, to supply a bridge output voltage (V_(OUT)) across thetwo output terminals 208, 212. It will be appreciated that the variableresistances 202 may be implemented, for example, using strain gauges, orthe like.

The signal conditioning circuit 106 is electrically coupled to theresistance bridge circuit 104, and more particularly is electricallycoupled to the excitation terminal 204, the circuit common terminal 206,and the two output terminals 208, 212. The signal conditioning circuit106 is configured, upon being electrically energized, to supply anelectrical excitation voltage (V_(EXC)) to the resistance bridge circuit104. The signal conditioning circuit 106 is additionally configured, inresponse to the bridge output voltage (V_(OUT)), to supply a sensoroutput signal representative thereof to the output connector 108.

The output connector 108 includes a plurality connector pins 122.Although the depicted output connector 108 includes 4 connector pins122, it will be appreciated that in some embodiments it may include moreor less than this number of connector pins. Regardless of the specificnumber, the output connector 108 is configured to connect tonon-illustrated external equipment to supply, via the connector pins122, the sensor output signal thereto for further processing.

The first and second test connectors 112, 114 are each electricallycoupled to different terminals of the resistance bridge circuit 104. Inparticular, the first test connector 112 is electrically coupled to oneof the two output terminals 208, 212, and the second test connector 114is electrically coupled to the circuit common terminal 206. In thedepicted embodiment, the first test connector 114 is electricallycoupled to the second output terminal 212. It will be appreciated,however, that in other embodiments the first test connector 114 couldinstead be electrically coupled to the first output terminal 208. In thedepicted embodiment, the first and second test connectors 112, 114 areformed separate from the output connector 108. It will be appreciatedthat in some embodiments, the first and second test connectors 112, 114could be formed as part of the output connector 108.

The first and second test connectors 112, 114 are each configured to becoupled to an impedance test device 214. The impedance test device 214may be any one of numerous impedance test devices now known or developedin the future. Some examples of suitable impedance test devices includea decade box, a programmable resistance, box, and a programmablecapacitance box, just to name a few non-limiting examples. As FIG. 2also depicts, a noise-reduction resistor 216 is preferably (though notnecessarily) connected between the first test connector and the outputterminal 208 or 212. The noise-reduction resistor 216 is preferably arelatively stable, relatively high fixed resistance (≧about 100 kΩ) toat least inhibit noise from entering the test device 214.

The impedance test device 214, when connected to the first and secondtest connectors 112, 114, may be used to vary the input to the signalconditioning circuit 106. This allows the performance of the signalconditioning circuit 106 to be characterized at various levels of inputand at different environmental conditions, such as differenttemperatures, while simultaneously characterizing the resistance bridgecircuit 104. The results of this characterization can be used tocalculate any corrections needed to compensate the signal conditioningcircuit 106 for performance shifts. An example process forsimultaneously characterizing the performance of the resistance bridgecircuit 104 and the signal conditioning circuit 106 will now bedescribed.

A sensor system 100 is disposed in a variable temperature test chamber,while the applied pressure is kept relatively constant. The test chamberis kept at a first temperature, such as ambient room temperature. Animpedance test device 214, such as a programmable resistor box (PRB), isconnected to the first and second test connectors 112, 114, but isdisposed outside the chamber at a stable, ambient room temperature.

After sufficient soak time at room temperature, the sensor system 100 isenergized and the output of the sensor system 100 is recorded. Thevariable impedance device 214 is then varied to simulate full scaleoutput or another predetermined output level of the sensor device 102.The temperature and the setting of the impedance test device 214 areboth recorded. The sensor system 100 is then de-energized and the testchamber is set to a second, relatively colder temperature. A suitablesecond temperature is about ≦32 F.

After a sufficient soak time at the second temperature, the sensorsystem 100 is again energized and the output of the sensor system 100 isrecorded. The variable impedance device 214 is once again varied tosimulate full scale output of the sensor device 102. The temperature andthe setting of the impedance test device 214 are both recorded. Thesensor system 100 is then de-energized and the test chamber is set to athird, relatively hotter temperature. A suitable third temperature isabout ≧100 F.

After a sufficient soak time at the third temperature, the sensor system100 is again energized and the output of the sensor system 100 isrecorded. The variable impedance device 214 is yet again varied tosimulate full scale output of the sensor device 102. The temperature andthe setting of the impedance test device 214 are both recorded. Thesensor system 100 is then de-energized and the test chamber is returnedto ambient.

The data recorded during the above process is then used tosimultaneously derive the temperature shift and offset of the sensordevice 102 and the temperature shift of the signal conditioning circuit106. These factors may then be compensated for.

Those of skill in the art will appreciate that the various illustrativelogical blocks, modules, circuits, and algorithm steps described inconnection with the embodiments disclosed herein may be implemented aselectronic hardware, computer software, or combinations of both. Some ofthe embodiments and implementations are described above in terms offunctional and/or logical block components (or modules) and variousprocessing steps. However, it should be appreciated that such blockcomponents (or modules) may be realized by any number of hardware,software, and/or firmware components configured to perform the specifiedfunctions. To clearly illustrate this interchangeability of hardware andsoftware, various illustrative components, blocks, modules, circuits,and steps have been described above generally in terms of theirfunctionality. Whether such functionality is implemented as hardware orsoftware depends upon the particular application and design constraintsimposed on the overall system. Skilled artisans may implement thedescribed functionality in varying ways for each particular application,but such implementation decisions should not be interpreted as causing adeparture from the scope of the present invention. For example, anembodiment of a system or a component may employ various integratedcircuit components, e.g., memory elements, digital signal processingelements, logic elements, look-up tables, or the like, which may carryout a variety of functions under the control of one or moremicroprocessors or other control devices. In addition, those skilled inthe art will appreciate that embodiments described herein are merelyexemplary implementations.

The various illustrative logical blocks, modules, and circuits describedin connection with the embodiments disclosed herein may be implementedor performed with a general purpose processor, a digital signalprocessor (DSP), an application specific integrated circuit (ASIC), afield programmable gate array (FPGA) or other programmable logic device,discrete gate or transistor logic, discrete hardware components, or anycombination thereof designed to perform the functions described herein.A general-purpose processor may be a microprocessor, but in thealternative, the processor may be any conventional processor,controller, microcontroller, or state machine. A processor may also beimplemented as a combination of computing devices, e.g., a combinationof a DSP and a microprocessor, a plurality of microprocessors, one ormore microprocessors in conjunction with a DSP core, or any other suchconfiguration.

The steps of a method or algorithm described in connection with theembodiments disclosed herein may be embodied directly in hardware, in asoftware module executed by a processor, or in a combination of the two.A software module may reside in RAM memory, flash memory, ROM memory,EPROM memory, EEPROM memory, registers, hard disk, a removable disk, aCD-ROM, or any other form of storage medium known in the art. Anexemplary storage medium is coupled to the processor such the processorcan read information from, and write information to, the storage medium.In the alternative, the storage medium may be integral to the processor.The processor and the storage medium may reside in an ASIC.

In this document, relational terms such as first and second, and thelike may be used solely to distinguish one entity or action from anotherentity or action without necessarily requiring or implying any actualsuch relationship or order between such entities or actions. Numericalordinals such as “first,” “second,” “third,” etc. simply denotedifferent singles of a plurality and do not imply any order or sequenceunless specifically defined by the claim language. The sequence of thetext in any of the claims does not imply that process steps must beperformed in a temporal or logical order according to such sequenceunless it is specifically defined by the language of the claim. Theprocess steps may be interchanged in any order without departing fromthe scope of the invention as long as such an interchange does notcontradict the claim language and is not logically nonsensical.

Furthermore, depending on the context, words such as “connect” or“coupled to” used in describing a relationship between differentelements do not imply that a direct physical connection must be madebetween these elements. For example, two elements may be connected toeach other physically, electronically, logically, or in any othermanner, through one or more additional elements.

While at least one exemplary embodiment has been presented in theforegoing detailed description of the invention, it should beappreciated that a vast number of variations exist. It should also beappreciated that the exemplary embodiment or exemplary embodiments areonly examples, and are not intended to limit the scope, applicability,or configuration of the invention in any way. Rather, the foregoingdetailed description will provide those skilled in the art with aconvenient road map for implementing an exemplary embodiment of theinvention. It being understood that various changes may be made in thefunction and arrangement of elements described in an exemplaryembodiment without departing from the scope of the invention as setforth in the appended claims.

What is claimed is:
 1. A sensor system with performance compensationtesting capability, comprising: a sensor device comprising a resistancebridge circuit, wherein the resistance bridge circuit comprises anexcitation terminal, a circuit common terminal, and two outputterminals; a signal conditioning circuit electrically coupled to theexcitation terminal, the circuit common terminal, and the two outputterminals, the signal conditioning circuit configured to supply a sensoroutput signal based on a bridge output voltage; a first test connectorelectrically coupled to one of the two output terminals, the first testconnector configured to be coupled to an impedance test device; and asecond test connector electrically coupled to the circuit commonterminal, the second test connector configured to be coupled to theimpedance test device to vary an input to the signal condition circuitfor simultaneous derivation of a first correction for the resistancebridge circuit and a second correction for the signal conditioningcircuit.
 2. The system of claim 1, wherein the first correctioncomprises at least one of a temperature shift or an offset of theresistance bridge circuit.
 3. The system of claim 1, wherein the secondcorrection comprises a temperature shift of the signal conditioningcircuit.
 4. The system of claim 1, further comprising: a noise-reductionresistor connected between the first test connector and one of the twooutput terminals.
 5. The system of claim 1, wherein the noise-reductionresistor has a resistance of at least 100 kilo-ohms.
 6. The system ofclaim 1, further comprising: a sensor housing assembly, wherein thesensor device, the resistance bridge circuit, the signal conditioningcircuit, the first test connector, and the second test connector are allmounted in or on the sensor housing assembly.
 7. The system of claim 1,wherein the sensor device is configured as a pressure sensor.
 8. Thesystem of claim 9, wherein the sensor device comprises a diaphragm-typepressure sensor.
 9. The system of claim 1, wherein a line directlyconnects the second test connector to the signal conditioning circuitwithout any components between the second test connector and the signalconditioning circuit.
 10. The system of claim 1, wherein the impedancetest device comprises a decade box, a programmable resistance box, or aprogrammable capacitance box.
 11. A method for testing a sensor circuit,the method comprising the steps of: connecting a impedance test deviceto the sensor circuit, wherein the sensor circuit comprises a sensordevice comprising a resistance bridge circuit electrically coupled to asignal conditioning circuit, wherein the signal conditioning circuit isconfigured to supply a sensor output signal representative of aresistance bridge output voltage, the impedance test device configuredto electrically couple a resistance to the sensor circuit; placing thesensor circuit at a first temperature; varying the impedance of theimpedance test device at a plurality of different temperatures;observing the sensor output signal while varying the impedance of theimpedance test device at the plurality of different temperatures; andsimultaneously deriving, based on the observing, a first temperatureshift of the sensor device and a second temperature shift of the signalconditioning circuit.
 12. The method of claim 11, wherein the resistancebridge circuit comprises an excitation terminal, a circuit commonterminal, and two output terminals, the resistance bridge circuitconfigured, upon being energized, to supply a bridge output voltageacross the two output terminals, and wherein the signal conditioningcircuit is electrically coupled to the excitation terminal, the circuitcommon terminal, and the two output terminals.
 13. The method of claim12, wherein the sensor circuit further comprises a first test connectorelectrically coupled to the circuit common terminal and to the impedancetest device; and a second test connector electrically coupled to one ofthe two output terminals and to the impedance test device.
 14. Themethod of claim 11, wherein the plurality of different temperaturescomprises at least a first temperature, a second temperature, and athird temperature.
 15. The method of claim 14, wherein the secondtemperature is lower than the first temperature, and the thirdtemperature is higher than the first temperature.
 16. The method ofclaim 11, further comprising, simultaneously deriving, based on theobserving, an offset of the sensor device while simultaneously derivingthe first temperature shift and the second temperature shift.
 17. Amethod comprising the steps of: disposing a resistance bridge circuit ona sensor device, the resistance bridge circuit comprising an excitationterminal, a circuit common terminal, and two output terminals;electrically connecting a signal conditioning circuit to the excitationterminal, the circuit common terminal, and the two output terminals;electrically coupling a first test connector to one of the two outputterminals, the first test connector configured to be coupled to animpedance test device; and electrically coupling a second test connectorto the circuit common terminal, the second test connector configured tobe coupled to the impedance test device to vary an input to the signalconditioning circuit for simultaneous derivation of a first temperatureshift of the resistance bridge circuit and a second temperature shift ofthe signal conditioning circuit.
 18. The method of claim 17, wherein thesensor device is configured as a pressure sensor.
 19. The method ofclaim 18, wherein the sensor device comprises a diaphragm-type pressuresensor.
 20. The method of claim 17, wherein the impedance test devicecomprises a decade box, a programmable resistance box, or a programmablecapacitance box.